Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: A. Benninghoven
Publisher: Wiley
Category : Science
Languages : en
Pages : 1008
View: 5509

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Book Description:
Consists of over 200 papers by acknowledged experts in their specialized fields. Offers a superlative overview of current research and technology in diverse areas running the gamut from environmental problems to depth profiling and semiconductors.


Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: Icon Group International
Publisher: ICON Group International
Category : Secondary ion mass spectrometry
Languages : en
Pages : 49
View: 3130

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Secondary Ion Mass Spectrometry Sims Viii

Secondary Ion Mass Spectrometry SIMS VIII PDF
Author: A. Benninghoven
Publisher: John Wiley & Sons Incorporated
Category : Science
Languages : en
Pages : 917
View: 678

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Book Description:
The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.


Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry PDF
Author: Robert G. Wilson
Publisher: Wiley-Interscience
Category : Science
Languages : en
Pages : 384
View: 4964

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Book Description:
Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.


Secondary Ion Mass Spectrometry Sims Xi

Secondary Ion Mass Spectrometry SIMS XI PDF
Author: G. Gillen
Publisher: Wiley
Category : Technology & Engineering
Languages : en
Pages : 1150
View: 3595

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Book Description:
This volume contains 252 contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, 1997. The book covers a diverse range ofresearch, reflecting the rapid growth in advanced semiconductorcharacterization, ultra shallow depth profiling, TOF-SIMS and thenew areas in which SIMS techniques are being used, for example inbiological sciences and organic surface characterization. Papersare presented under the following categories: * Isotopic SIMS * Biological SIMS * Semiconductor Characterization Techniques and Applications * Ultra Shallow Depth Profiling * Depth Profiling Fundamental/Modelling and Diffusion * Sputter-Induced Topography * Fundamentals of Molecular Desorption * Organic Materials * Practical TOF-SIMS * Polyatomic Primary Ions * Materials/Surface Analysis * Postionization * Instrumentation * Geological SIMS * Imaging * Fundamentals of Sputtering * Ion Formation and Cluster Formation * Quantitative Analysis Environmental/ParticleCharacterization * Related Techniques These proceedings provide an invaluable source of reference forboth newcomers to the field and experienced SIMS users.


Secondary Ion Mass Spectroscopy Of Solid Surfaces

Secondary Ion Mass Spectroscopy of Solid Surfaces PDF
Author: V. T. Cherepin
Publisher: CRC Press
Category : Science
Languages : en
Pages : 138
View: 1748

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Book Description:
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.